دانلود کتاب تصویربرداری اشعه ایکس: اصول، تکنیک های صنعتی و کاربرد
X-Ray Imaging: Fundamentals, Industrial Techniques and Applications, 1ed

“This book is a major contribution from leaders in the field of x-ray imaging. It provides an excellent foundation in x-ray physics, as well as a rigorous introduction to x-ray imaging along with an abundant collection of applications. I especially like the rich historical background that is provided along with the x-ray fundamentals. The applications collected from the extensive professional experience of the authors are both instructive and timely.”
―James F. Shackelford, University of California, Davis, USA

“I like this book very much. It contains very comprehensive explanations of the x-ray imaging methods and physics behind them. This book goes beyond what is typically covered in general NDT or radiography books and includes many particularly interesting insights from the authors. The significant technical details discussed are useful to an advanced practitioner wishing to understand or expand their knowledge and employ advanced x-ray methods to solve inspection problems.”
―Richard Bossi, Retired Senior Technical Fellow from The Boeing Company, Seattle, Washington, USA

“The book is an excellent survey of the NDE field.”
―Carl Crawford, Csuptwo, LLC, Glendale, Wisconsin, USA

“Love it! Great easy to follow material for those who want to learn about industrial/security NDE. For the experts this will be a great reference book. The amount of topics covered is beyond the expertise of most professionals, so there is something to learn here for all of us.”
― Richard Robehr Bijjani, Quanttus, Boston, Massachusetts, USA

“A very important book, not to be missed or ignored!”
― Franco Casali, University of Bologna and Academy of Science of Bologna, Italy

“While books on the medical applications of X-ray imaging exist, there is not one currently available that focuses on industrial applications. Full of color images that show clear spectrometry and rich with applications, X-ray Imaging fills the need for a comprehensive work on modern industrial X-ray imaging. It reviews the fundamental science of X-ray imaging and addresses equipment and system configuration. Useful to a broad range of radiation imaging practitioners, the book looks at the rapid development and deployment of digital X-ray imaging system.”
―Materials Evaluation, May 2016

Harry E. Martz is the director of the Nondestructive Characterization Institute and a distinguished member of the technical staff at the Lawrence Livermore National Laboratory. He is also principal investigator for the Department of Homeland Security, Science and Technology, Explosives Division; the Domestic Nuclear Detection Office, Nuclear and Radiological Imaging Platform; and Passive and x-ray Imaging Scanning Projects. He has also served on several National Academy of Sciences committees on aviation security and was the chair of the Committee on Airport Passenger Screening: Backscatter x-ray Machines. He is a member of the Physics Honor Society Sigma Pi Sigma.

Clinton M. Logan began his career at the Lawrence Livermore National Laboratory in 1963 after receiving his BSME degree from Montana State University. In 1993, Clint won a US Department of Energy (DOE) grant to apply Lawrence Livermore National Laboratory (LLNL) resources to support Fischer Imaging Corporation in the design of their full-field digital mammography unit for cancer screening. Clint holds five US patents in accelerator and x-ray technology. He is a registered professional engineer in California, a member emeritus of the American Association of Physicists in Medicine, and a fellow of the American Society of Mechanical Engineers.

Daniel J. Schneberk received undergraduate degrees (one of them in mathematics) from the University of Oregon and a master’s in statistics from the University of California, Berkeley (UC Berkeley). In 1988, Dan took an opportunity to join the nondestructive evaluation group at LLNL, collaborating with Harry Martz and initially working for Clint Logan on materials inspection and characterization issues in the x-Ray Laser Project. His work in NDE has continued to the present. He has received two LLNL Directors Performance Awards and awards from Ford and NASA. Dan is a member of Phi Beta Kappa.

Peter J. Shull is an associate professor of engineering at Penn State Altoona. Dr. Shull has worked in the field of NDE for over 20 years while at the Institute of Standards and Technology (NIST) in the Materials Reliability Division in Boulder, Colorado; at The Johns Hopkins University; and at The Pennsylvania State University. Dr. Shull’s primary research focus is NDE applied to process control. He has authored numerous publications, and is a member of the American Society of Nondestructive Testing, the American Society of Engineering Educators, and the Institute of Electrical and Electronic Engineers.